On Optimizing the Reliability and Performance on 3D NAND Flash Memory
3D NAND 閃存可靠性與性能的改進研究
Student thesis: Doctoral Thesis
Research Output
- 2023
- Published
Read Disturb and Reliability: The Complete Story for 3D CT NAND Flash
Ren, T., Li, Q., Ye, M. & Xue, C. J., 2023, Proceedings - 2023 12th IEEE Non-Volatile Memory Systems and Applications Symposium, NVMSA 2023. Los Alamitos, Calif.: Institute of Electrical and Electronics Engineers, Inc., 6 p. (Proceedings - IEEE Non-Volatile Memory Systems and Applications Symposium, NVMSA).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
Scopus citations: 3 - 2022
- Published
Resolving the Reliability Issues of Open Blocks for 3-D NAND Flash: Observations and Strategies
Li, Q., Ye, M., Cui, Y., Ren, T., Kuo, T.-W. & Xue, C. J., Nov 2022, In: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41, 11, p. 4076-4087Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 2 - Online published
Stop unnecessary refreshing: extending 3D NAND flash lifetime with ORBER
Ye, M., Li, Q., Gao, C., Deng, S., Kuo, T.-W. & Xue, C. J., 8 Jun 2022, (Online published) In: CCF Transactions on High Performance Computing.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 3 - Published
Reprogramming 3D TLC Flash Memory based Solid State Drives
GAO, C., YE, M., XUE, C. J., ZHANG, Y., SHI, L., SHU, J. & YANG, J., Feb 2022, In: ACM Transactions on Storage. 18, 1, 9.Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Scopus citations: 7 - 2021
- Published
How the common retention acceleration method of 3D NAND flash memory goes wrong?
Li, Q., Ye, M., Kuo, T.-W. & Xue, C. J., Jul 2021, HotStorage 2021 - Proceedings of the 13th ACM Workshop on Hot Topics in Storage and File Systems. Association for Computing Machinery, Inc, p. 1-7 (HotStorage - Proceedings of the ACM Workshop on Hot Topics in Storage and File Systems).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
Scopus citations: 11 - 2020
- Published
Shaving Retries with Sentinels for Fast Read over High-Density 3D Flash
Li, Q., Ye, M., Cui, Y., Shi, L., Li, X., Kuo, T.-W. & Xue, C. J., Oct 2020, Proceedings: 2020 53rd Annual IEEE/ACM International Symposium on Microarchitecture MICRO 2020. Institute of Electrical and Electronics Engineers, p. 483-495 09251942. (Proceedings of the Annual International Symposium on Microarchitecture, MICRO).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
Scopus citations: 32 - Published
Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory
Ye, M., Li, Q., Nie, J., Kuo, T.-W. & Xue, C. J., Mar 2020, Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE 2020). Natale, G. D., Bolchini, C. & Vatajelu, E.-I. (eds.). Institute of Electrical and Electronics Engineers, p. 109-114 9116337. (Design, Automation and Test in Europe Conference and Exhibition).Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
Scopus citations: 2
