Hot-electron induced degradation in short-channel MOSFET and novel device structure for suppressing short-channel effects

Student thesis: Master's Thesis

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Author(s)

  • Kwok Leung YIP

Related Research Unit(s)

Detail(s)

Awarding Institution
Supervisors/Advisors
  • Yiu Chung CHENG (Supervisor)
  • Hei WONG (Co-supervisor)
Award date30 Oct 1995

    Research areas

  • Metal oxide semiconductor field-effect transistors, Failures, Semiconductors