This study looks at the use of non-conducting adhesives (NCA) in very fine pitch COF
application. NCA exists in 2 forms; semi-solid (NCF) and liquid adhesives (NCP). The
handling of non-conducting paste (NCP) varies from the film form adhesive, since a
dispensing process is needed for NCP application. Dispensing of NCP was difficult in
not providing good coverage on the contact pattern of the substrate and this high
viscosity NCP would easily entrap voids in these fine pitch interconnections. These
voids entrapped in the product could deteriorate electrical contact, and also shorten its
reliability performance by providing vulnerable points for moisture attack. For this pair
of test chips and substrates with a contact area of about 3x11mm, the NCP was
dispensed in a line form onto the substrate. The NCP used was controlled to be 3.5mg,
which did not cause contamination of the bond head did provide a good bond line.
Control of some parameters and pretreatment of the material used successfully reduced
the entrapment of voids in the joints. Polyimide substrate pre-baking at 120oC extracted
the moisture from surfaces, and thus increased surface energy and improve wetability
of this adhesive on the substrate. A stage heating process reduced the viscosity of the
adhesive and so improved spreading and wetting on the substrate. Bonding temperature,
descending speed of the bond heating tool, and also bonding pressure induced
rheological changes in the adhesive, and thus, with a proper combination of these
parameters, a significant reduction of percentage of voids in the interconnections was
achieved.
NCA bonding depends on direct contact built in the interconnection to achieve good
electrical contact. This NCA will react once a temperature is applied. The melting and
cross-linking process in the NCA ensured the formation of good contact points in the
joint, and also acted as a strong holding force in the interconnections. The results of
NCF-bonded chip-on-flex (COFs) at different bonding temperatures showed a high peel
strength value at a high bonding temperature. A high bonding temperature accelerated
high cure reaction and polymerization process in the adhesive. The degree of cure in
the adhesive was influenced by the bonding temperature. This polymerization induced
cross-linking between the long chain molecules in the adhesive, which eventually
created its high modulus and flexural strength. Also a high bonding temperature gave a
build up of cohesive strength in the adhesive and also adhesive strength with the
adjacent surfaces. This interlocking force between the adhesive with the chip and
substrate was indicated directly by the peel strength. Thus, a high peel strength
suggested a better cure in the adhesive as well. This study shows that at the same
bonding pressure, an optimum electrical contact was obtained when sufficient melting
occurred at the contact points of the joints. A low bonding temperature did not give
good melting in the interconnection joint, and increased electrical failure by forming an
adhesive barrier insulation layer in the joints. However, an excessively high bonding
temperature of 240oC and above, caused instant curing at the contact points in a joint
and built up a cured barrier layer in the joint which prohibited a good electrical contact.
An aging process by introducing a reflow at 260°C on the COF pieces shows that a degree of cure ~86% and above was able to provide a consistent and reliable electrical
contact in these joints.
The third part of the study investigated the bonding pressure effect on this NCA
application. The bonding pressure effect played an effective role in regulating the
electrical contact in the joints especially with the film form NCF. Both the NCF and
NCP from different vendors were used for COF bonding at a range of different bonding
pressures. A better electrical contact was achieved with NCP bonded COFs compared
to NCF bonded COFs. The initial NCP rheological properties which was in liquid paste
form was better for the spreading and squeezing procedures which increased the contact
area of the joints. The electrical contact formed through NCF bonding faced a few
deficiencies as it was initially in semi-solid form which was pre-tacked onto the
substrate. The squeezing process of the adhesive from the contact points was not as
efficient in this case as in the NCP bonded case. An environmental thermal stress
evaluation of these NCA bonded COFs showed that the NCP bonded ones were better.
A low CTE value and also a high modulus in the NCP was judged as the contribution
factors to achieve this result. A high bonding force NCF bonded COF, at 100N and
above, was able to give better squeezing of adhesive from the contact points. Less
adhesive remnant trapped in the joint reduced the z-direction expansion. This prevented
the interconnection from building up a joint gap at the contact point which broke the
electrical connection path in the joints. Thus, a higher bonding pressure in the NCF
application was able to improve the reliability of the joints.
This study shows that a suitable selection of bonding temperature, pressure and other
parameters are able to optimize the electrical and mechanical performance of these
NCA bonded COFs. A higher bonding pressure is preferred to overcome the problem
with voids, and also create better electrical contact. A low bonding temperature which
causes low melting in the adhesive, and also extremely high bonding temperature
which induced instant curing of the joint was not a good choice to give a reliable NCA
bonded COFs pieces. A low CTE and high modulus adhesive is preferred in NCA
bonding applications.
| Date of Award | 15 Feb 2006 |
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| Original language | English |
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| Awarding Institution | - City University of Hong Kong
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| Supervisor | Yan Cheong CHAN (Supervisor) |
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- Flip chip technology
- Solder and soldering
- Microelectronic packaging
- Chip scale packaging
Study on non-conducting adhesives onto application of fine pitch flip chip interconnection
TAN, S. C. (Author). 15 Feb 2006
Student thesis: Master's Thesis