Study of track etch rate for alpha particles for CR-39 by atomic force microscopy

  • Pui Yee Joan HO

    Student thesis: Master's Thesis

    Date of Award16 Feb 2004
    Original languageEnglish
    Awarding Institution
    • City University of Hong Kong
    SupervisorKwan Ngok Peter YU (Supervisor)

    Keywords

    • Nuclear track detectors
    • Particle track etching
    • Alpha rays
    • Atomic force microscopy
    • Particle tracks (Nuclear physics)

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