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Hot-electron induced degradation in short-channel MOSFET and novel device structure for suppressing short-channel effects

  • Kwok Leung YIP

Student thesis: Master's Thesis

Date of Award30 Oct 1995
Original languageEnglish
Awarding Institution
  • City University of Hong Kong
SupervisorYiu Chung CHENG (Supervisor) & Hei WONG (Co-supervisor)

Keywords

  • Metal oxide semiconductor field-effect transistors
  • Failures
  • Semiconductors

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