Power semiconductor devices are the soul of power electronic systems, among which,
the power MOSFET distinguishes itself upon the center stage of high-frequency and
medium/low power applications. With rapid increase in the switching frequencies of power
converters, the parasitic elements in both the circuit and the power MOSFET itself exert
more and more significant influence on the switching performance of the power MOSFET.
There are two typical configurations in which the power MOSFET operates in the power
electronic systems: one is the MOSFET-diode configuration, the other is the bridge-leg
configuration. This thesis focuses on establishing a detailed analytical model for the
switching behavior of the power MOSFET in these two configurations. It considers all
crucial parasitic elements and the interaction between the gate drive stage and the power
stage. A more insightful understanding of the switching characteristics of the power
MOSFET can thereby be acquired.
Snubber circuit is often adopted in the switch-diode configuration to alleviate the
voltage stress across the switching device. Existing design for the switch-snubber-diode
configuration is conducted by separately considering the switch and the snubber circuit,
while in fact they can interact with each other. To optimize the circuit design in terms of
power losses and voltage stress, the effect of the gate drive resistance on the losses of the
MOSFET–snubber–diode configuration will be investigated. The concept of optimal gate
drive resistance in such a configuration will thereby be proposed.
With the increase in the switching speed and power level in the bridge-leg
configuration, the spurious triggering pulse in the synchronous switch is liable to exceed
the threshold voltage and cause spurious turn-on. Eliminating the spurious turn-on plays an important role in preventing excessive switching losses, circuit oscillation and shootthrough.
In this thesis, this problem will be tackled from two aspects based on the
synchronous buck converter with power MOSFETs as the switching devices. On the one
hand, the magnitude of the spurious triggering pulse should be minimized by optimized
circuit design. In this light, the mechanism and contributing factors of the spurious
triggering pulse will be clarified by an elaborate model of the switching transition when the
pulse turns up. On the other hand, a novel RCD level-shifter circuit will be proposed to
shift the spurious triggering pulse below the threshold voltage to avoid spurious turn-on.
The work of this thesis can help identify the most influential factors on the switching
characteristics of the power MOSFET, and cast light on the characterization of other
switching devices, such as IGBT. Accordingly, circuit designers can make targeted
decisions in component selection, PCB layout and trouble-shooting; process and package
engineers can interpret the expectations on the circuit-level performance of the power
MOSFET into the requirements on its parameters, and optimize the physical-level and the
package design of the power MOSFET.
| Date of Award | 15 Jul 2014 |
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| Original language | English |
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| Awarding Institution | - City University of Hong Kong
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| Supervisor | Shu Hung Henry CHUNG (Supervisor) |
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- Metal oxide semiconductor field-effect transistors
- Semiconductor switches
Characterization and modeling of the switching behavior of power MOSFET in power electronic systems
WANG, J. (Author). 15 Jul 2014
Student thesis: Doctoral Thesis