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XPS study on the effects of thermal annealing on CeO2/La2O3 stacked gate dielectrics
Jieqiong Zhang*, Hei Wong, Kuniyuki Kakushima, Hiroshi Iwai
*Corresponding author for this work
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
37
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(Scopus)