X-ray photoelectron diffraction study of ultrathin PbTiO3 films

L. Despont; C. Lichtensteiger; F. Clerc; M. G. Garnier; F. J. Garcia De Abajo; M. A. Van Hove; J. M. Triscone; P. Aebi

doi:10.1140/epjb/e2006-00050-0

X-ray photoelectron diffraction study of ultrathin PbTiO₃ films

L. Despont
, C. Lichtensteiger
, F. Clerc
, M. G. Garnier
, F. J. Garcia De Abajo
, M. A. Van Hove
, J. M. Triscone
, P. Aebi

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

13 Citations (Scopus)

Abstract

Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO₃ (PTO) films grown on Nb-doped SrTiO₃ substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 Å -thick PTO film. Multiple scattering theory based on a cluster-model [ Phys. Rev. B 63, 075404 (2001)] is used to simulate the experiments.
© EDP Sciences, Società Italiana di Fisica, Springer-Verlag 2006

Original language	English
Pages (from-to)	141-146
Journal	European Physical Journal B
Volume	49
Issue number	2
DOIs	https://doi.org/10.1140/epjb/e2006-00050-0
Publication status	Published - Jan 2006

Bibliographical note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Funding

Skillful technical assistance was provided by the Neuchˆatel workshop and electric engineering team. This project has been supported by the Swiss National Science Foundation through the National Center of Competence in Research “Materials with Novel Electronic Properties-MaNEP”, and in part by the Office of Science, Materials Sciences Division, of the U.S. Department of Energy under Contract No. DE-AC03-76SF00098.

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Cite this

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abstract = "Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO3 (PTO) films grown on Nb-doped SrTiO3 substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 {\AA} -thick PTO film. Multiple scattering theory based on a cluster-model [ Phys. Rev. B 63, 075404 (2001)] is used to simulate the experiments. {\textcopyright} EDP Sciences, Societ{\`a} Italiana di Fisica, Springer-Verlag 2006",

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AU - Despont, L.

AU - Lichtensteiger, C.

AU - Clerc, F.

AU - Garnier, M. G.

AU - Garcia De Abajo, F. J.

AU - Van Hove, M. A.

AU - Triscone, J. M.

AU - Aebi, P.

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AB - Full hemispherical X-ray photoelectron diffraction (XPD) experiments have been performed to investigate at the atomic level ultrathin epitaxial c-axis oriented PbTiO3 (PTO) films grown on Nb-doped SrTiO3 substrates. Comparison between experiment and theory allows us to identify a preferential ferroelectric polarization state in a 60 Å -thick PTO film. Multiple scattering theory based on a cluster-model [ Phys. Rev. B 63, 075404 (2001)] is used to simulate the experiments. © EDP Sciences, Società Italiana di Fisica, Springer-Verlag 2006

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