Wetting and interfacial reactions of Sn-Zn based lead-free solder alloys as replacement of Sn-Pb solder

M. N. Islam, Y. C. Chan

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

4 Citations (Scopus)

Abstract

The world is moving toward 'green products' for electronic devices and components due to toxicity of Pb. In this paper two types of solder paste such as Sn-9Zn (eutectic) and Sn-8Zn-3Bi (noneutectic) have been investigated along with Sn-37Pb (eutectic) solder for reference. The variation of dissolution of Cu layer and IMCs with reflow time shows different characteristics for eutectic and non-eutectic solder pastes. The morphologies of the IMCs are quite different for different solder compositions. During as reflowed, the growth rate of IMCs in the Sn-Zn based solder is higher than the Sn-Pb solders. Different types of IMCs such as γ- Cu5Zn8, β-CuZn and thin unknown Cu-Zn layer are formed in the Sn-Zn based solder but in case of Sn-Pb solder Cu6Sn5 IMCs layer are formed at the interface of the Cu/solder joint. Cu3Sn IMCs are formed after 10 minutes reflow due to the limited supply of Sn from the Sn-Pb solder. The wettability of Sn-Zn solder is found as least compared with the other solders. The size of Zn platelets is increased with an increase of reflow time for the Sn-Zn solder system. In the case of Sn-Zn-Bi solder, Bi offers significant effects on growth rate of IMCs as well as size and distribution of Zn-rich phase in the β-Sn matrix. No Cu-Sn IMCs are found in the Sn-Zn based solder during 20 minutes reflow, Cu-Zn IMCs act as a good diffusion barrier for Sn. The consumption of Cu by all types of solders are ranked as Sn-Zn-Bi>Sn-Zn>Sn-Pb. Although Sn-Zn-Bi solder has higher dissolution rate of Cu layer and some voids are found at the interface, it can be used as a replacement of conventional Sn-Pb solder in the electronic industry. © 2005 IEEE.
Original languageEnglish
Title of host publicationProceeding of 2005 International Conference on Asian Green Electronics- Design for Manufacturability and Reliability, 2005AGEC
Pages178-184
Volume2005
DOIs
Publication statusPublished - 2005
Event2005 International Conference on Asian Green Electronics- Design for Manufacturability and Reliability, 2005AGEC - Shanghai, China
Duration: 15 Mar 200518 Mar 2005

Publication series

Name
Volume2005

Conference

Conference2005 International Conference on Asian Green Electronics- Design for Manufacturability and Reliability, 2005AGEC
Country/TerritoryChina
CityShanghai
Period15/03/0518/03/05

Research Keywords

  • Dissolution of Cu
  • Intermetallics
  • Sn-Zn based solders

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