TY - JOUR
T1 - Wettability and other properties of amorphous hydrogenated carbon (a-C
T2 - 2002 IEEE International Conference on plasma Science
AU - Yang, P.
AU - Chen, J. Y.
AU - Leng, Y. X.
AU - Wang, J.
AU - Wan, G. J.
AU - Huang, N.
AU - Leng, Y.
AU - Chu, P. K.
PY - 2002
Y1 - 2002
N2 - Hydrogenated amorphous carbon films (a-C:H) are fabricated on silicon (100) wafers at room temperature using plasma immersion ion implantation - deposition (PIII-D). By adjusting the deposition conditions and annealing parameters (in vacuum between 400-700°C), a series of a-C:H films with different hydrogen contents, structures, and chemical bonds are obtained. The film chemistry is investigated using micro-Raman spectroscopy. The surface morphology of the films is characterized using the atomic force microscopy (AFM). The composition is measured by Rutherford backscattering spectrometry (RBS) and elastic recoil detection (ERD). Fourier transform infrared spectroscope (FTIR) is utilized to characterize the bonding characteristics of hydrogen to carbon in the a-C:H films. The wettability of the films is investigated by contact angle measurements with different well-known liquids and physiological solutions. The surface energy and its polar and dispersive part are determined. The experimental results are used to study the influence of the different composition and structure on the wettability of the a-C:H films, a parameter that is crucial to biomedical applications.
AB - Hydrogenated amorphous carbon films (a-C:H) are fabricated on silicon (100) wafers at room temperature using plasma immersion ion implantation - deposition (PIII-D). By adjusting the deposition conditions and annealing parameters (in vacuum between 400-700°C), a series of a-C:H films with different hydrogen contents, structures, and chemical bonds are obtained. The film chemistry is investigated using micro-Raman spectroscopy. The surface morphology of the films is characterized using the atomic force microscopy (AFM). The composition is measured by Rutherford backscattering spectrometry (RBS) and elastic recoil detection (ERD). Fourier transform infrared spectroscope (FTIR) is utilized to characterize the bonding characteristics of hydrogen to carbon in the a-C:H films. The wettability of the films is investigated by contact angle measurements with different well-known liquids and physiological solutions. The surface energy and its polar and dispersive part are determined. The experimental results are used to study the influence of the different composition and structure on the wettability of the a-C:H films, a parameter that is crucial to biomedical applications.
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M3 - RGC 22 - Publication in policy or professional journal
SN - 0730-9244
JO - IEEE International Conference on Plasma Science
JF - IEEE International Conference on Plasma Science
Y2 - 26 May 2002 through 30 May 2002
ER -