wearMeter: an Accurate Wear Metric for NAND Flash Memory

Min Ye; Qiao Li; Daniel Wen; Tei-Wei Kuo; Chun Jason Xue

doi:10.1109/ASP-DAC58780.2024.10473972

wearMeter: an Accurate Wear Metric for NAND Flash Memory

Min Ye
, Qiao Li^*
, Daniel Wen
, Tei-Wei Kuo
, Chun Jason Xue

^*Corresponding author for this work

Department of Computer Science

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

3 Citations (Scopus)

Abstract

The program/erase (P/E) cycle is frequently utilized as a yardstick for indicating the wear degree of flash memory. However, this metric exhibits a significant limitation in accuracy. After enduring the same number of P/E cycles, the wear degree of flash memory could vary due to factors such as ambient temperatures and dwell time between two P/E cycles. To reflect the true wear degree of flash memory, this paper proposes an accurate and consistent metric, wearMeter. The proposed metric, independent of wear sources, guarantees accurate offline wear measurement. Moreover, by comparing to the error-correcting capability of the ECC engine, it offers a straightforward assessment of block remaining reliability margins. Leveraging wearMeter, this paper further proposes a novel low-wear Single-Level Cell (SLC) mode, lSLC, which significantly reduces wear compared to the default SLC mode. Experiments show that lSLC demonstrates over 3X the P/E cycles of the default SLC mode under the same conditions, without performance losses. © 2024 IEEE.

Original language	English
Title of host publication	ASP-DAC 2024 - 29th Asia and South Pacific Design Automation Conference, Proceedings
Subtitle of host publication	29th Asia and South Pacific Design Automation Conference, Proceedings
Publisher	IEEE
Pages	442-447
ISBN (Electronic)	979-8-3503-9354-5
ISBN (Print)	979-8-3503-9355-2
DOIs	https://doi.org/10.1109/ASP-DAC58780.2024.10473972
Publication status	Published - 2024
Event	29th Asia and South Pacific Design Automation Conference (ASP-DAC 2024) - Songdo Convensia, Incheon, Korea, Republic of Duration: 22 Jan 2024 → 25 Jan 2024 https://www.aspdac.com/aspdac2024/

Publication series

Name	Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
ISSN (Print)	2153-6961
ISSN (Electronic)	2153-697X

Conference

Conference	29th Asia and South Pacific Design Automation Conference (ASP-DAC 2024)
Place	Korea, Republic of
City	Incheon
Period	22/01/24 → 25/01/24
Internet address	https://www.aspdac.com/aspdac2024/

Bibliographical note

Full text of this publication does not contain sufficient affiliation information. With consent from the author(s) concerned, the Research Unit(s) information for this record is based on the existing academic department affiliation of the author(s).

Funding

This work was supported in part by the Research Grants Council of the Hong Kong Special Administrative Region, China (Project No. CityU 11218720), and the National Natural Science Foundation of China under Grant No. 62202396. The corresponding author is Qiao Li ([email protected]).

Research Keywords

3D NAND flash
accurate wear metric
wear degree

RGC Funding Information

RGC-funded

Access Output

10.1109/ASP-DAC58780.2024.10473972

Other Access Options

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Cite this

Ye, M., Li, Q., Wen, D., Kuo, T.-W., & Xue, C. J. (2024). wearMeter: an Accurate Wear Metric for NAND Flash Memory. In ASP-DAC 2024 - 29th Asia and South Pacific Design Automation Conference, Proceedings: 29th Asia and South Pacific Design Automation Conference, Proceedings (pp. 442-447). (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). IEEE. https://doi.org/10.1109/ASP-DAC58780.2024.10473972

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title = "wearMeter: an Accurate Wear Metric for NAND Flash Memory",

abstract = "The program/erase (P/E) cycle is frequently utilized as a yardstick for indicating the wear degree of flash memory. However, this metric exhibits a significant limitation in accuracy. After enduring the same number of P/E cycles, the wear degree of flash memory could vary due to factors such as ambient temperatures and dwell time between two P/E cycles. To reflect the true wear degree of flash memory, this paper proposes an accurate and consistent metric, wearMeter. The proposed metric, independent of wear sources, guarantees accurate offline wear measurement. Moreover, by comparing to the error-correcting capability of the ECC engine, it offers a straightforward assessment of block remaining reliability margins. Leveraging wearMeter, this paper further proposes a novel low-wear Single-Level Cell (SLC) mode, lSLC, which significantly reduces wear compared to the default SLC mode. Experiments show that lSLC demonstrates over 3X the P/E cycles of the default SLC mode under the same conditions, without performance losses. {\textcopyright} 2024 IEEE.",

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author = "Min Ye and Qiao Li and Daniel Wen and Tei-Wei Kuo and Xue, \{Chun Jason\}",

note = "Full text of this publication does not contain sufficient affiliation information. With consent from the author(s) concerned, the Research Unit(s) information for this record is based on the existing academic department affiliation of the author(s).; 29th Asia and South Pacific Design Automation Conference (ASP-DAC 2024) ; Conference date: 22-01-2024 Through 25-01-2024",

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Ye, M , Li, Q, Wen, D, Kuo, T-W & Xue, CJ 2024, wearMeter: an Accurate Wear Metric for NAND Flash Memory. in ASP-DAC 2024 - 29th Asia and South Pacific Design Automation Conference, Proceedings: 29th Asia and South Pacific Design Automation Conference, Proceedings. Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, IEEE, pp. 442-447, 29th Asia and South Pacific Design Automation Conference (ASP-DAC 2024), Incheon, Korea, Republic of, 22/01/24. https://doi.org/10.1109/ASP-DAC58780.2024.10473972

wearMeter: an Accurate Wear Metric for NAND Flash Memory. / Ye, Min ; Li, Qiao; Wen, Daniel et al.
ASP-DAC 2024 - 29th Asia and South Pacific Design Automation Conference, Proceedings: 29th Asia and South Pacific Design Automation Conference, Proceedings. IEEE, 2024. p. 442-447 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - wearMeter

T2 - 29th Asia and South Pacific Design Automation Conference (ASP-DAC 2024)

AU - Ye, Min

AU - Li, Qiao

AU - Wen, Daniel

AU - Kuo, Tei-Wei

AU - Xue, Chun Jason

N1 - Full text of this publication does not contain sufficient affiliation information. With consent from the author(s) concerned, the Research Unit(s) information for this record is based on the existing academic department affiliation of the author(s).

PY - 2024

Y1 - 2024

N2 - The program/erase (P/E) cycle is frequently utilized as a yardstick for indicating the wear degree of flash memory. However, this metric exhibits a significant limitation in accuracy. After enduring the same number of P/E cycles, the wear degree of flash memory could vary due to factors such as ambient temperatures and dwell time between two P/E cycles. To reflect the true wear degree of flash memory, this paper proposes an accurate and consistent metric, wearMeter. The proposed metric, independent of wear sources, guarantees accurate offline wear measurement. Moreover, by comparing to the error-correcting capability of the ECC engine, it offers a straightforward assessment of block remaining reliability margins. Leveraging wearMeter, this paper further proposes a novel low-wear Single-Level Cell (SLC) mode, lSLC, which significantly reduces wear compared to the default SLC mode. Experiments show that lSLC demonstrates over 3X the P/E cycles of the default SLC mode under the same conditions, without performance losses. © 2024 IEEE.

AB - The program/erase (P/E) cycle is frequently utilized as a yardstick for indicating the wear degree of flash memory. However, this metric exhibits a significant limitation in accuracy. After enduring the same number of P/E cycles, the wear degree of flash memory could vary due to factors such as ambient temperatures and dwell time between two P/E cycles. To reflect the true wear degree of flash memory, this paper proposes an accurate and consistent metric, wearMeter. The proposed metric, independent of wear sources, guarantees accurate offline wear measurement. Moreover, by comparing to the error-correcting capability of the ECC engine, it offers a straightforward assessment of block remaining reliability margins. Leveraging wearMeter, this paper further proposes a novel low-wear Single-Level Cell (SLC) mode, lSLC, which significantly reduces wear compared to the default SLC mode. Experiments show that lSLC demonstrates over 3X the P/E cycles of the default SLC mode under the same conditions, without performance losses. © 2024 IEEE.

KW - 3D NAND flash

KW - accurate wear metric

KW - wear degree

UR - https://www.scopus.com/pages/publications/85189363594

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U2 - 10.1109/ASP-DAC58780.2024.10473972

DO - 10.1109/ASP-DAC58780.2024.10473972

M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 979-8-3503-9355-2

T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

SP - 442

EP - 447

BT - ASP-DAC 2024 - 29th Asia and South Pacific Design Automation Conference, Proceedings

PB - IEEE

Y2 - 22 January 2024 through 25 January 2024

ER -

Ye M , Li Q, Wen D, Kuo TW, Xue CJ. wearMeter: an Accurate Wear Metric for NAND Flash Memory. In ASP-DAC 2024 - 29th Asia and South Pacific Design Automation Conference, Proceedings: 29th Asia and South Pacific Design Automation Conference, Proceedings. IEEE. 2024. p. 442-447. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). Epub 2024 Mar 25. doi: 10.1109/ASP-DAC58780.2024.10473972

wearMeter: an Accurate Wear Metric for NAND Flash Memory

Abstract

Publication series

Conference

Bibliographical note

Funding

Research Keywords

RGC Funding Information

Access Output

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Permanent Link

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GRF: Cutting the Tail Latency for Low-Cost High-Density Server SSDs with Reliability Considerations

Cite this

wearMeter: an Accurate Wear Metric for NAND Flash Memory

Abstract

Publication series

Conference

Bibliographical note

Funding

Research Keywords

RGC Funding Information

Access Output

Other Access Options

Permanent Link

Other Files and Links

Fingerprint

Projects

GRF: Cutting the Tail Latency for Low-Cost High-Density Server SSDs with Reliability Considerations

Cite this