Abstract
A new method of solving the complex transmittance function of a weak object, proposed for the scanning transmission electron microscope (STEM) using images obtained by four quadrant detectors, is discussed and tested using computer simulated images. The effects of noise on the method are considered. Satisfactory image reconstructions are found for phase steps less than equivalent to 0. 2 rad. and amplitude transmission greater than equivalent to 0. 9.
| Original language | English |
|---|---|
| Pages (from-to) | 229-246 |
| Journal | Optik (Jena) |
| Volume | 68 |
| Issue number | 3 |
| Publication status | Published - Oct 1984 |
| Externally published | Yes |
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