Wavelet-based simulations of electromagnetic scattering from large-scale two-dimensional perfectly conducting random rough surfaces

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)718-725
Journal / PublicationIEEE Transactions on Geoscience and Remote Sensing
Volume39
Issue number4
Publication statusPublished - Apr 2001

Abstract

Simulations of electromagnetic waves scattering from two-dimensional perfectly conducting random rough surfaces are performed using the method of moment (MoM) and the electric field integral equation (EFIE). Using wavelets as basis and testing functions, the resulting moment matrix is generally sparse after applying a threshold truncation. This property makes wavelets particularly useful in simulating large-scale problems, in which reducing memory storage requirement and CPU time are crucial. In this paper, scattering from Gaussian conducting rough surfaces of a few hundred square wavelengths are studied numerically using Haar wavelets. A matrix sparsity less than 10% is achieved for a range of root mean square (RMS) height at eight sampling points per linear wavelength. Parallelization of the code is also performed. Simulation results of the bistatic scattering coefficients are presented for different surface RMS heights up to 1 wavelength. Comparsions with sparse-matrix/canonical-grid approach (SM/CG) and triangular discretized (RWG basis) results are made as well. Depolarization effects are examined for both TE and TM incident waves. The relative merits of the SM/CG method and the present method are discussed.

Research Area(s)

  • Electric field integral equation (EFIE), Electromagnetic scattering, Method of moment (MoM), Rough surfaces, Wavelet basis

Citation Format(s)

Wavelet-based simulations of electromagnetic scattering from large-scale two-dimensional perfectly conducting random rough surfaces. / Xia, M. Y.; Chan, Chi H.; Li, Shu-Qing; Hu, Jin-Lin; Tsang, Leung.

In: IEEE Transactions on Geoscience and Remote Sensing, Vol. 39, No. 4, 04.2001, p. 718-725.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review