Visualizing Point Defects in Transition-Metal Dichalcogenides Using Optical Microscopy

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • Hye Yun Jeong
  • Si Young Lee
  • Gang Hee Han
  • Hyun Kim
  • Honggi Nam
  • Zhao Jiong
  • Bong Gyu Shin
  • Seok Joon Yun
  • Jaesu Kim
  • Un Jeong Kim
  • Sungwoo Hwang
  • Young Hee Lee

Detail(s)

Original languageEnglish
Pages (from-to)770-777
Journal / PublicationACS Nano
Volume10
Issue number1
Online published8 Dec 2015
Publication statusPublished - 26 Jan 2016
Externally publishedYes

Abstract

While transmission electron microscopy and scanning tunneling microscopy reveal atomic structures of point defect and grain boundary in monolayer transitionmetal dichalcogenides (TMDs), information on point defect distribution in macroscale is still not available. Herein, we visualize the point defect distribution of monolayer TMDs using dark-field optical microscopy. This was realized by anchoring silver nanoparticles on defect sites of MoS2 under light illumination. The optical images clearly revealed that the point defect distribution varies with light power and exposure time. The number of silver nanoparticles increased initially and reached a plateau in response to light power or exposure time. The size of silver nanoparticles was a few hundred nanometers in the plateau region as observed using optical microscopy. The measured defect density in macroscale was ∼2 × 1010 cm-2, slightly lower than the observed value (4 × 1011 cm-2) from scanning tunneling microscopy.

Research Area(s)

  • Ag nanoparticle, Dark-field optical microscopy, Light illumination, Molybdenum disulfide, Point defect distribution

Citation Format(s)

Visualizing Point Defects in Transition-Metal Dichalcogenides Using Optical Microscopy. / Jeong, Hye Yun; Lee, Si Young; Ly, Thuc Hue et al.

In: ACS Nano, Vol. 10, No. 1, 26.01.2016, p. 770-777.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review