Visible Metasurfaces for On-Chip Polarimetry

Pin Chieh Wu; Jia-Wern Chen; Chih-Wei Yin; Yi-Chieh Lai; Tsung Lin Chung; Chun Yen Liao; Bo Han Chen; Kuan-Wei Lee; Chin-Jung Chuang; Chih-Ming Wang; Din Ping Tsai

doi:10.1021/acsphotonics.7b01527

Visible Metasurfaces for On-Chip Polarimetry

Pin Chieh Wu^*, Jia-Wern Chen, Chih-Wei Yin, Yi-Chieh Lai, Tsung Lin Chung, Chun Yen Liao, Bo Han Chen, Kuan-Wei Lee, Chin-Jung Chuang, Chih-Ming Wang, Din Ping Tsai

^*Corresponding author for this work

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

143 Citations (Scopus)

Abstract

Measuring the polarization state of light and determining the optical properties of chiral materials are inherently complex issues because of the requirement of consequential measurements between different orthogonal states of polarization. Here, we introduce an on-chip polarimetry based on the visible metasurfaces for addressing the issue of polarization analysis with compact components. We demonstrate integrated metasurface chips can effectively determine a set of Stokes parameters covering a broad wave-band at visible light. For the proof of concept, the optical properties of chiral materials are measured using our proposed device, while experimental verifications are convincing by comparing with the data obtained from commercial ellipsometry.

Original language	English
Pages (from-to)	2568-2573
Journal	ACS Photonics
Volume	5
Issue number	7
DOIs	https://doi.org/10.1021/acsphotonics.7b01527
Publication status	Published - 18 Jul 2018
Externally published	Yes

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Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Research Keywords

aluminum plasmonics
on-chip polarimetry
polarization analysis
visible metasurfaces

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title = "Visible Metasurfaces for On-Chip Polarimetry",

abstract = "Measuring the polarization state of light and determining the optical properties of chiral materials are inherently complex issues because of the requirement of consequential measurements between different orthogonal states of polarization. Here, we introduce an on-chip polarimetry based on the visible metasurfaces for addressing the issue of polarization analysis with compact components. We demonstrate integrated metasurface chips can effectively determine a set of Stokes parameters covering a broad wave-band at visible light. For the proof of concept, the optical properties of chiral materials are measured using our proposed device, while experimental verifications are convincing by comparing with the data obtained from commercial ellipsometry.",

keywords = "aluminum plasmonics, on-chip polarimetry, polarization analysis, visible metasurfaces",

author = "Wu, {Pin Chieh} and Jia-Wern Chen and Chih-Wei Yin and Yi-Chieh Lai and Chung, {Tsung Lin} and Liao, {Chun Yen} and Chen, {Bo Han} and Kuan-Wei Lee and Chin-Jung Chuang and Chih-Ming Wang and Tsai, {Din Ping}",

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T1 - Visible Metasurfaces for On-Chip Polarimetry

AU - Wu, Pin Chieh

AU - Chen, Jia-Wern

AU - Yin, Chih-Wei

AU - Lai, Yi-Chieh

AU - Chung, Tsung Lin

AU - Liao, Chun Yen

AU - Chen, Bo Han

AU - Lee, Kuan-Wei

AU - Chuang, Chin-Jung

AU - Wang, Chih-Ming

AU - Tsai, Din Ping

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 2018/7/18

Y1 - 2018/7/18

N2 - Measuring the polarization state of light and determining the optical properties of chiral materials are inherently complex issues because of the requirement of consequential measurements between different orthogonal states of polarization. Here, we introduce an on-chip polarimetry based on the visible metasurfaces for addressing the issue of polarization analysis with compact components. We demonstrate integrated metasurface chips can effectively determine a set of Stokes parameters covering a broad wave-band at visible light. For the proof of concept, the optical properties of chiral materials are measured using our proposed device, while experimental verifications are convincing by comparing with the data obtained from commercial ellipsometry.

AB - Measuring the polarization state of light and determining the optical properties of chiral materials are inherently complex issues because of the requirement of consequential measurements between different orthogonal states of polarization. Here, we introduce an on-chip polarimetry based on the visible metasurfaces for addressing the issue of polarization analysis with compact components. We demonstrate integrated metasurface chips can effectively determine a set of Stokes parameters covering a broad wave-band at visible light. For the proof of concept, the optical properties of chiral materials are measured using our proposed device, while experimental verifications are convincing by comparing with the data obtained from commercial ellipsometry.

KW - aluminum plasmonics

KW - on-chip polarimetry

KW - polarization analysis

KW - visible metasurfaces

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U2 - 10.1021/acsphotonics.7b01527

DO - 10.1021/acsphotonics.7b01527

M3 - RGC 21 - Publication in refereed journal

SN - 2330-4022

VL - 5

SP - 2568

EP - 2573

JO - ACS Photonics

JF - ACS Photonics

IS - 7

ER -

Visible Metasurfaces for On-Chip Polarimetry

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