Viscoelastic creep and relaxation of dielectric elastomers characterized by a Kelvin-Voigt-Maxwell model

Junshi Zhang; Jie Ru; Hualing Chen; Dichen Li; Jian Lu

doi:10.1063/1.4974991

Viscoelastic creep and relaxation of dielectric elastomers characterized by a Kelvin-Voigt-Maxwell model

Junshi Zhang
, Jie Ru
, Hualing Chen^*
, Dichen Li
, Jian Lu

^*Corresponding author for this work

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

100 Citations (Scopus)

159 Downloads (CityUHK Scholars)

Abstract

For dielectric elastomers (DEs), the inherent viscoelasticity leads to a time-dependent deformation during actuation. To describe such a viscoelastic behavior, a constitutive model is developed by utilizing a combined Kelvin-Voigt-Maxwell (KVM) model. The established model captures both the initial jumping deformation and the following slow creeping. Subsequently, with an employment of VHB 4910 elastomer, experiments are performed to validate the viscoelastic KVM model. The results indicate a good agreement between the simulation and experimental data. Effect of the parameters in KVM model on the viscoelastic deformation of DEs is also investigated.

Original language	English
Article number	44104
Journal	Applied Physics Letters
Volume	110
Issue number	4
DOIs	https://doi.org/10.1063/1.4974991
Publication status	Published - 23 Jan 2017

Publisher's Copyright Statement

COPYRIGHT TERMS OF DEPOSITED FINAL PUBLISHED VERSION FILE: This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Junshi Zhang, Jie Ru, Hualing Chen, Dichen Li, and Jian Lu , "Viscoelastic creep and relaxation of dielectric elastomers characterized by a Kelvin-Voigt-Maxwell model", Appl. Phys. Lett. 110, 044104 (2017) and may be found at https://doi.org/10.1063/1.4974991.

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abstract = "For dielectric elastomers (DEs), the inherent viscoelasticity leads to a time-dependent deformation during actuation. To describe such a viscoelastic behavior, a constitutive model is developed by utilizing a combined Kelvin-Voigt-Maxwell (KVM) model. The established model captures both the initial jumping deformation and the following slow creeping. Subsequently, with an employment of VHB 4910 elastomer, experiments are performed to validate the viscoelastic KVM model. The results indicate a good agreement between the simulation and experimental data. Effect of the parameters in KVM model on the viscoelastic deformation of DEs is also investigated.",

author = "Junshi Zhang and Jie Ru and Hualing Chen and Dichen Li and Jian Lu",

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T1 - Viscoelastic creep and relaxation of dielectric elastomers characterized by a Kelvin-Voigt-Maxwell model

AU - Zhang, Junshi

AU - Ru, Jie

AU - Chen, Hualing

AU - Li, Dichen

AU - Lu, Jian

PY - 2017/1/23

Y1 - 2017/1/23

N2 - For dielectric elastomers (DEs), the inherent viscoelasticity leads to a time-dependent deformation during actuation. To describe such a viscoelastic behavior, a constitutive model is developed by utilizing a combined Kelvin-Voigt-Maxwell (KVM) model. The established model captures both the initial jumping deformation and the following slow creeping. Subsequently, with an employment of VHB 4910 elastomer, experiments are performed to validate the viscoelastic KVM model. The results indicate a good agreement between the simulation and experimental data. Effect of the parameters in KVM model on the viscoelastic deformation of DEs is also investigated.

AB - For dielectric elastomers (DEs), the inherent viscoelasticity leads to a time-dependent deformation during actuation. To describe such a viscoelastic behavior, a constitutive model is developed by utilizing a combined Kelvin-Voigt-Maxwell (KVM) model. The established model captures both the initial jumping deformation and the following slow creeping. Subsequently, with an employment of VHB 4910 elastomer, experiments are performed to validate the viscoelastic KVM model. The results indicate a good agreement between the simulation and experimental data. Effect of the parameters in KVM model on the viscoelastic deformation of DEs is also investigated.

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U2 - 10.1063/1.4974991

DO - 10.1063/1.4974991

M3 - RGC 21 - Publication in refereed journal

SN - 0003-6951

VL - 110

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 4

M1 - 44104

ER -

Viscoelastic creep and relaxation of dielectric elastomers characterized by a Kelvin-Voigt-Maxwell model

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