TY - JOUR
T1 - Vapor sensor realized in an ultracompact polarization interferometer built of a freestanding porous-silicon form birefringent film
AU - Beom-Hoan, O.
AU - Liu, Rong
AU - Li, Yang Yang
AU - Sailor, Michael J.
AU - Fainman, Yeshaiahu
PY - 2003/6
Y1 - 2003/6
N2 - A novel vapor sensor that uses polarization interferometry in a form birefringent porous-silicon film is introduced, analyzed, and experimentally characterized. Simulations and analysis of accuracy, versatility, stability, and control of dynamic range of the device are provided. The simulation accurately predicts the polarization interference signal, which is used to estimate the effective refractive indexes characterizing the form birefringence of a porous-silicon film with 0.001 accuracy. The device was tested for the detection of heptane concentration in a range of 342-20 000 ppm (=2.0%).
AB - A novel vapor sensor that uses polarization interferometry in a form birefringent porous-silicon film is introduced, analyzed, and experimentally characterized. Simulations and analysis of accuracy, versatility, stability, and control of dynamic range of the device are provided. The simulation accurately predicts the polarization interference signal, which is used to estimate the effective refractive indexes characterizing the form birefringence of a porous-silicon film with 0.001 accuracy. The device was tested for the detection of heptane concentration in a range of 342-20 000 ppm (=2.0%).
KW - Form birefringence
KW - Polarization interferometry
KW - Porous silicon
KW - Vapor sensor
UR - http://www.scopus.com/inward/record.url?scp=0038540129&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0038540129&origin=recordpage
U2 - 10.1109/LPT.2003.811344
DO - 10.1109/LPT.2003.811344
M3 - RGC 21 - Publication in refereed journal
SN - 1041-1135
VL - 15
SP - 834
EP - 836
JO - IEEE Photonics Technology Letters
JF - IEEE Photonics Technology Letters
IS - 6
ER -