Valid Window : A New Metric to Measure the Reliability of NAND Flash Memory

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review

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Detail(s)

Original languageEnglish
Title of host publicationProceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
EditorsGiorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu
PublisherIEEE
Pages109-114
Number of pages6
ISBN (Print)978-3-9819263-4-7
Publication statusPublished - Mar 2020

Publication series

NameProceedings of the Design, Automation and Test in Europe Conference and Exhibition

Conference

Title2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
PlaceFrance
CityGrenoble
Period9 - 13 March 2020

Abstract

NAND flash memory has been widely adopted in storage systems today. The most important issue in flash memory is its reliability, especially for 3D NAND, which suffers from several types of errors. The raw bit error rate (RBER) when applying default read reference voltages is usually adopted as the reliability metric for NAND flash memory. However, RBER is closely related to the way how data is read, and varies greatly if read retry operations are conducted with tuned read reference voltages. In this work, a new metric, valid window is proposed to measure the reliability, which is stable and accurate. A valid window expresses the size of error regions between two neighboring levels and determines if the data can be correctly read with further read retry. Taking advantage of these features, we design a method to reduce the number of read retry operations. This is achieved by adjusting program operations of 3D NAND flash memories. Experiments on a real 3D NAND flash chip verify the effectiveness of the proposed method.

Citation Format(s)

Valid Window : A New Metric to Measure the Reliability of NAND Flash Memory. / Ye, Min; Li, Qiao; Nie, Jianqiang; Kuo, Tei-Wei; Xue, Chun Jason.

Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. ed. / Giorgio Di Natale; Cristiana Bolchini; Elena-Ioana Vatajelu. IEEE, 2020. p. 109-114 9116337 (Proceedings of the Design, Automation and Test in Europe Conference and Exhibition).

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)peer-review