Using accelerated life tests data to predict warranty cost under imperfect repair

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journal

20 Scopus Citations
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Original languageEnglish
Pages (from-to)223-234
Journal / PublicationComputers and Industrial Engineering
Publication statusPublished - 1 May 2017


For new products that have not been put on the market, manufacturers usually want to predict the warranty cost to forecast its influence on future profit. In the test phase of new products, accelerated life tests (ALT) are commonly used to predict the lifetime under use condition. In this paper, we present a framework to predict the warranty cost and risk under one-dimensional warranty by analyzing ALT experimental data. Two sources of variability are considered to make inferences of predicted warranty cost: the uncertainty of estimated parameters from ALT data and the variation in field conditions. Under these assumptions, the expected warranty cost and warranty risk is computed by Markov chain Monte Carlo (MCMC) sampling based on the approximated lifetime distribution. We assume that the warranty guarantees imperfect repairs. The framework could be easily repeated for ALT data based on log-location-scale lifetime distributions and both constant-stress and step-stress ALT data. Compared with original Monte Carlo (MC) simulation, the proposed method provides comparable prediction accuracy with significantly less computational effort. A numerical example with sensitivity analysis is given to illustrate the effectiveness of the proposed methods.

Research Area(s)

  • Accelerated life test, Fisher information, Maximum likelihood estimation, Warranty claim prediction, Weibull distribution