機器學習算法實現亞衍射極限的納米尺度光學顯微圖像轉換爲大視場掃描電子顯微鏡質素圖像方法

Research output: Patents, Agreements and AssignmentsRGC 51 - Patents (CityU)

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Original languageChinese (Traditional)
Filing number202211041006.4
Publication status
  • Accepted/In press/Filed - 29 Aug 2022