在低溫下任意表面上的納米碲電子器件的氣相沉積
Research output: Patents, Agreements and Assignments › RGC 51 - Patents (CityU)
Author(s)
Related Research Unit(s)
Detail(s)
Original language | Chinese (Traditional) |
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Filing number | 202310684717.1 |
Publication status |
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Link(s)
Permanent Link | https://scholars.cityu.edu.hk/en/publications/publication(28222f00-31d0-49a7-a75c-18388f684f98).html |
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Citation Format(s)
在低溫下任意表面上的納米碲電子器件的氣相沉積. / HO, Johnny Chung Yin (Inventor); MENG, You (Inventor); WANG, Wei (Inventor) et al.
Jun 09, 2023.
Jun 09, 2023.
Research output: Patents, Agreements and Assignments › RGC 51 - Patents (CityU)