Ultra high density optical recording using a scanning near-field optical microscope
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 244-248 |
Journal / Publication | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 3276 |
Publication status | Published - 1998 |
Externally published | Yes |
Conference
Title | Miniaturized Systems with Micro-Optics and Micromechanics III |
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Place | United States |
City | San Jose, CA |
Period | 26 - 27 January 1998 |
Link(s)
Abstract
Near-field scanning optical microscope (NSOM) system with a bent or a straight optical fiber probe has been successfully developed to perform optical recording on the surface of cyanine (C35H35ClN2O4) dye layer or Ge21Te26Sb53 phase change (PC) thin film. Optical writing bits < 40 nm on the cyanine dye layer of a commercial compact disk-recordable (CD-R) were shown by atomic force microscope (AFM) images of our tapping mode NSOM. For an vertical reflection mode NSOM, both optical writing and reading can be achieved on Ge21Te26Sb53 PC thin film, and the diameter of 500 nm recording bits are shown.
Research Area(s)
- Compact disk-recordable, Near-field optical recording, Near-field scanning optical microscope, Phase change thin film
Bibliographic Note
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Citation Format(s)
Ultra high density optical recording using a scanning near-field optical microscope. / Lu, Yuan Ying; Tsai, Din Ping; Guo, Wen Rei; Chen, Sheng-Chang; Liu, Jia Reuy; Shieh, Han Ping D.
In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3276, 1998, p. 244-248.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review