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Ultra flexible SiGe/Si/Cr nanosprings

  • D. Grützmacher*
  • , L. Zhang
  • , L. Dong
  • , D. Bell
  • , B. Nelson
  • , A. Prinz
  • , E. Ruh
  • *Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

The electrical and mechanical properties of Si/SiGe rolled-up nanosprings have been investigated. Micromanipulation has been employed to investigate the mechanical properties. For nanosprings under investigation, a linear dependence between applied force and extention is found until the spring is extended to 91% of its original length, moreover, the springs could be reproducibly extended to more than 180% of their original length. An extremely small spring constant of 0.003 N/m has been determined, which is an order of magnitude smaller than that of the most flexible available atomic force microscope (AFM) cantilever (∼10-2 N/m). Thus, it is expected that these springs can be used as ultra-sensitive force sensors. A simple estimation assuming an imaging resolution of approximately 1 nm is adopted for displacement measurement and reveals that using a nanospring fabricated from a 300 nm wide mesa as a visual-based force sensor, a resolution of 3 pN/nm can be provided. The conductivity of nanospirals was analysed and current densities up to 530 kA/cm2 were measured. Structures with metallic wires on top of the mesa structures were successfully employed to activate mechanical movements of the structure.
Original languageEnglish
Pages (from-to)478-481
JournalMicroelectronics Journal
Volume39
Issue number3-4
Online published17 Oct 2007
DOIs
Publication statusPublished - Mar 2008
Externally publishedYes

Research Keywords

  • Mechanical properties
  • NEMS
  • Rolled-up nanostructures
  • Self-assembled SiGe nanostructures

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