Twin-Boundary Reduced Surface Diffusion on Electrically Stressed Copper Nanowires

Wei-Lun Weng, Hsin-Yu Chen, Yi-Hsin Ting, Hsin-Yi Tiffany Chen, Wen-Wei Wu, King-Ning Tu, Chien-Neng Liao*

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

8 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Twin-Boundary Reduced Surface Diffusion on Electrically Stressed Copper Nanowires'. Together they form a unique fingerprint.

Material Science