Tuning exchange bias in epitaxial Ni/MgO/TiN heterostructures integrated on Si(100)

F. Wu; S.S. Rao; J.T. Prater; Y.T. Zhu; J. Narayan

doi:10.1016/j.cossms.2014.09.002

Author(s)

F. Wu
S.S. Rao
J.T. Prater
Y.T. Zhu
J. Narayan

Detail(s)

Original language	English
Pages (from-to)	263-268
Journal / Publication	Current Opinion in Solid State and Materials Science
Volume	18
Issue number	5
Online published	27 Sept 2014
Publication status	Published - Oct 2014
Externally published	Yes

Link(s)

DOI	DOI https://doi.org/10.1016/j.cossms.2014.09.002 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-84919392750&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(1779905e-dabb-45a6-98b5-ec20332f2e92).html

Abstract

Epitaxial Ni thin films are integrated with tunneling barrier MgO on Si(100) substrate. During pulsed laser deposition, early island-like structure transformed into uniform thin film with increasing number of laser pulses. This led to transitions in exchange bias from positive to negative and back to positive, which is ascribed to morphology associated residual strain. The Ni island structure has a coercive field as high as 3 times of that of the continuous film. The current work holds a tremendous promise in the realization of magnetic devices integrated with the Si-platform.

Research Area(s)

Domain matching epitaxy, Epitaxial Ni thin films, Exchange bias, Pulsed laser deposition

Citation Format(s)

[ RIS ] [ BibTeX ]

Tuning exchange bias in epitaxial Ni/MgO/TiN heterostructures integrated on Si(100). / Wu, F.; Rao, S.S.; Prater, J.T. et al.
In: Current Opinion in Solid State and Materials Science, Vol. 18, No. 5, 10.2014, p. 263-268.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Wu, F, Rao, SS, Prater, JT, Zhu, YT & Narayan, J 2014, 'Tuning exchange bias in epitaxial Ni/MgO/TiN heterostructures integrated on Si(100)', Current Opinion in Solid State and Materials Science, vol. 18, no. 5, pp. 263-268. https://doi.org/10.1016/j.cossms.2014.09.002

Wu, F., Rao, S. S., Prater, J. T., Zhu, Y. T., & Narayan, J. (2014). Tuning exchange bias in epitaxial Ni/MgO/TiN heterostructures integrated on Si(100). Current Opinion in Solid State and Materials Science, 18(5), 263-268. https://doi.org/10.1016/j.cossms.2014.09.002

Wu F, Rao SS, Prater JT, Zhu YT, Narayan J. Tuning exchange bias in epitaxial Ni/MgO/TiN heterostructures integrated on Si(100). Current Opinion in Solid State and Materials Science. 2014 Oct;18(5):263-268. Epub 2014 Sept 27. doi: 10.1016/j.cossms.2014.09.002

Wu, F. ; Rao, S.S. ; Prater, J.T. et al. / Tuning exchange bias in epitaxial Ni/MgO/TiN heterostructures integrated on Si(100). In: Current Opinion in Solid State and Materials Science. 2014 ; Vol. 18, No. 5. pp. 263-268.