Tungsten segregation in α2 + γ titanium aluminides
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
| Original language | English |
|---|---|
| Pages (from-to) | 497-500 |
| Journal / Publication | Intermetallics |
| Volume | 5 |
| Issue number | 7 |
| Publication status | Published - 1997 |
| Externally published | Yes |
Link(s)
Abstract
Atom probe field ion microscopy investigations of α2+ γ Ti-47%Al-2%Cr-1.8%Nb doped with 0.15% B and 0.2% W indicate that the tungsten segregates to both γ/γ and α2/γ interfaces. The interfacial coverage of tungsten at a specific γ/γ interface was estimated to be 2.3% which yields a segregation enhancement factor of ∼ 14. Initial results give no appreciable evidence of boron segregation to interphase interfaces. Interfacial segregation of tungsten supports the previous observation that tungsten additions stabilize the α2 lamellae against dissolution during aging. © 1997 Elsevier Science Limited.
Research Area(s)
- A. titanium aluminides, B. phase composition, B. segregation, Based on TiAl, F. atom microprobe
Citation Format(s)
Tungsten segregation in α2 + γ titanium aluminides. / Larson, D. J.; Liu, C. T.; Miller, M. K.
In: Intermetallics, Vol. 5, No. 7, 1997, p. 497-500.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
