Tungsten segregation in α2 + γ titanium aluminides

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)497-500
Journal / PublicationIntermetallics
Volume5
Issue number7
Publication statusPublished - 1997
Externally publishedYes

Abstract

Atom probe field ion microscopy investigations of α2+ γ Ti-47%Al-2%Cr-1.8%Nb doped with 0.15% B and 0.2% W indicate that the tungsten segregates to both γ/γ and α2/γ interfaces. The interfacial coverage of tungsten at a specific γ/γ interface was estimated to be 2.3% which yields a segregation enhancement factor of ∼ 14. Initial results give no appreciable evidence of boron segregation to interphase interfaces. Interfacial segregation of tungsten supports the previous observation that tungsten additions stabilize the α2 lamellae against dissolution during aging. © 1997 Elsevier Science Limited.

Research Area(s)

  • A. titanium aluminides, B. phase composition, B. segregation, Based on TiAl, F. atom microprobe

Citation Format(s)

Tungsten segregation in α2 + γ titanium aluminides. / Larson, D. J.; Liu, C. T.; Miller, M. K.

In: Intermetallics, Vol. 5, No. 7, 1997, p. 497-500.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review