Abstract
A metal-cluster-decoration approach is utilized to tailor electronic transport properties (e.g., threshold voltage) of III-V NWFETs through the modulation of free carriers in the NW channel via the deposition of different metal clusters with different work function. The versatility of this technique has been demonstrated through the fabrication of high-mobility enhancement-mode InAs NW parallel FETs as well as the construction of low-power InAs NW inverters. Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
| Original language | English |
|---|---|
| Pages (from-to) | 4445-4451 |
| Journal | Advanced Materials |
| Volume | 25 |
| Issue number | 32 |
| DOIs | |
| Publication status | Published - 27 Aug 2013 |
Research Keywords
- contact printing
- III-V nanowire field-effect transistors
- inverters
- metal decoration
- n-channel metal-oxide-semiconductor (NMOS)
- threshold voltage modulation
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