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Tunable electronic transport properties of metal-cluster-decorated III-V nanowire transistors

  • Ning Han
  • , Fengyun Wang
  • , Jared J. Hou
  • , Sen Po Yip
  • , Hao Lin
  • , Fei Xiu
  • , Ming Fang
  • , Zaixing Yang
  • , Xiaoling Shi
  • , Guofa Dong
  • , Tak Fu Hung
  • , Johnny C. Ho

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

A metal-cluster-decoration approach is utilized to tailor electronic transport properties (e.g., threshold voltage) of III-V NWFETs through the modulation of free carriers in the NW channel via the deposition of different metal clusters with different work function. The versatility of this technique has been demonstrated through the fabrication of high-mobility enhancement-mode InAs NW parallel FETs as well as the construction of low-power InAs NW inverters. Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Original languageEnglish
Pages (from-to)4445-4451
JournalAdvanced Materials
Volume25
Issue number32
DOIs
Publication statusPublished - 27 Aug 2013

Research Keywords

  • contact printing
  • III-V nanowire field-effect transistors
  • inverters
  • metal decoration
  • n-channel metal-oxide-semiconductor (NMOS)
  • threshold voltage modulation

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