Abstract
Recently, the group maximum differentiation competition (gMAD) has been used to improve blind image quality assessment (BIQA) models, with the help of full-reference metrics. When applying this type of approach to troubleshoot “best-performing” BIQA models in the wild, we are faced with a practical challenge: it is highly nontrivial to obtain stronger competing models for efficient failure-spotting. Inspired by recent findings that difficult samples of deep models may be exposed through network pruning, we construct a set of “self-competitors,” as random ensembles of pruned versions of the target model to be improved. Diverse failures can then be efficiently identified via self-gMAD competition. Next, we fine-tune both the target and its pruned variants on the human-rated gMAD set. This allows all models to learn from their respective failures, preparing themselves for the next round of self-gMAD competition. Experimental results demonstrate that our method efficiently troubleshoots BIQA models in the wild with improved generalizability.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2021 |
| Publisher | IEEE |
| Pages | 16251-16260 |
| ISBN (Print) | 9781665445092 |
| DOIs | |
| Publication status | Published - 2021 |
| Event | 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR 2020) - Virtual, Seattle, United States Duration: 13 Jun 2020 → 19 Jun 2020 http://cvpr2020.thecvf.com/ http://openaccess.thecvf.com/content_CVPR_2020/html/Guo_Zero-Reference_Deep_Curve_Estimation_for_Low-Light_Image_Enhancement_CVPR_2020_paper.html https://ieeexplore.ieee.org/xpl/conhome/9142308/proceeding http://cvpr2021.thecvf.com/ https://ieeexplore.ieee.org/xpl/conhome/1000147/all-proceedings https://openaccess.thecvf.com/CVPR2021 |
Publication series
| Name | Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition |
|---|---|
| ISSN (Print) | 1063-6919 |
| ISSN (Electronic) | 2575-7075 |
Conference
| Conference | 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR 2020) |
|---|---|
| Abbreviated title | CVPR2020 |
| Place | United States |
| City | Seattle |
| Period | 13/06/20 → 19/06/20 |
| Internet address |
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Bibliographical note
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