Towards an integrated materials characterization toolbox

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)62_Review of books or of software (or similar publications/items)

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  • Ian M. Robertson
  • Christopher A. Schuh
  • John S. Vetrano
  • Nigel D. Browning
  • David P. Field
  • Dorte Juul Jensen
  • Michael K. Miller
  • Ian Baker
  • David C. Dunand
  • Rafal Dunin-Borkowski
  • Bernd Kabius
  • Tom Kelly
  • Sergio Lozano-Perez
  • Amit Misra
  • Gregory S. Rohrer
  • Anthony D. Rollett
  • Mitra L. Taheri
  • Greg B. Thompson
  • Michael Uchic
  • Gary Was


Original languageEnglish
Pages (from-to)1341-1383
Journal / PublicationJournal of Materials Research
Issue number11
Publication statusPublished - 14 Jun 2011
Externally publishedYes


The material characterization toolbox has recently experienced a number of parallel revolutionary advances, foreshadowing a time in the near future when material scientists can quantify material structure evolution across spatial and temporal space simultaneously. This will provide insight to reaction dynamics in four-dimensions, spanning multiple orders of magnitude in both temporal and spatial space. This study presents the authors' viewpoint on the material characterization field, reviewing its recent past, evaluating its present capabilities, and proposing directions for its future development. Electron microscopy; atom probe tomography; x-ray, neutron and electron tomography; serial sectioning tomography; and diffraction-based analysis methods are reviewed, and opportunities for their future development are highlighted. Advances in surface probemicroscopy have been reviewed recently and, therefore, are not included [D.A.Bonnell et al.: Rev.Modern Phys. in Review]. In this study particular attention is paid to studies that have pioneered the synergetic use of multiple techniques to provide complementary views of a single structure or process; several of these studies represent the stateof-the-art in characterization and suggest a trajectory for the continued development of the field. Based on this review, a set of grand challenges for characterization science is identified, including suggestions for instrumentation advances, scientific problems in microstructure analysis, and complex structure evolution problems involving material damage. The future of microstructural characterization is proposed to be one not only where individual techniques are pushed to their limits, but where the community devises strategies of technique synergy to address complex multiscale problems in materials science and engineering. © Materials Research Society 2011.

Citation Format(s)

Towards an integrated materials characterization toolbox. / Robertson, Ian M.; Schuh, Christopher A.; Vetrano, John S.; Browning, Nigel D.; Field, David P.; Jensen, Dorte Juul; Miller, Michael K.; Baker, Ian; Dunand, David C.; Dunin-Borkowski, Rafal; Kabius, Bernd; Kelly, Tom; Lozano-Perez, Sergio; Misra, Amit; Rohrer, Gregory S.; Rollett, Anthony D.; Taheri, Mitra L.; Thompson, Greg B.; Uchic, Michael; Wang, Xun-Li; Was, Gary.

In: Journal of Materials Research, Vol. 26, No. 11, 14.06.2011, p. 1341-1383.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)62_Review of books or of software (or similar publications/items)