Toward electron exit wave tomography of amorphous materials at atomic resolution

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

1 Scopus Citations
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Author(s)

  • Konstantin B. Borisenko
  • Grigore Moldovan
  • Angus I. Kirkland
  • Dirk Van Dyck
  • Hsin-Yu Tang

Detail(s)

Original languageEnglish
Pages (from-to)S94-S98
Journal / PublicationJournal of Alloys and Compounds
Volume536
Issue numberSuppl.1
Early online date28 Nov 2011
Publication statusPublished - 25 Sep 2012
Externally publishedYes

Abstract

We suggest to use electron exit wave phase for tomographic reconstruction of structure of Au-doped amorphous Si with atomic resolution. In the present theoretical investigation into the approach it is found that the number of projections and the accuracy of defocus in the focal series restoration are the main factors that contribute to the final resolution. Although resolution is ultimately limited by these factors, phase shifts in the exit wave are sufficient to identify the position of Au atoms in an amorphous Si needle model, even when only 19 projections with defocus error of 4 nm are used. Electron beam damage will probably further limit the resolution of such tomographic reconstructions, however beam damage can be mitigated using lower accelerating voltages.

Research Area(s)

  • Amorphous materials, Atomic structure, Electron exit wave, Electron tomography

Citation Format(s)

Toward electron exit wave tomography of amorphous materials at atomic resolution. / Borisenko, Konstantin B.; Moldovan, Grigore; Kirkland, Angus I.; Van Dyck, Dirk; Tang, Hsin-Yu; Chen, Fu-Rong.

In: Journal of Alloys and Compounds, Vol. 536, No. Suppl.1, 25.09.2012, p. S94-S98.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review