Topographical Effect on Natural Killer Cell Locomotion in 3D Microenvironment

Yuanhao XU; S. W. Pang

Topographical Effect on Natural Killer Cell Locomotion in 3D Microenvironment

Research output: Conference Papers › RGC 32 - Refereed conference paper (without host publication) › peer-review

Original language	English
Publication status	Published - Jun 2017
Event	61st International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN 2017) - Orlando, United States Duration: 30 May 2017 → 2 Jun 2017 http://eipbn.omnibooksonline.com/ http://www.eipbn.org/historical-proceedings/

Conference

Conference	61st International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN 2017)
Place	United States
City	Orlando
Period	30/05/17 → 2/06/17
Internet address	http://eipbn.omnibooksonline.com/ http://www.eipbn.org/historical-proceedings/

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@conference{d1005abe7fe147ad895a30600040eb49,

title = "Topographical Effect on Natural Killer Cell Locomotion in 3D Microenvironment",

author = "Yuanhao XU and Pang, {S. W.}",

year = "2017",

month = jun,

language = "English",

note = "61st International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN 2017) ; Conference date: 30-05-2017 Through 02-06-2017",

url = "http://eipbn.omnibooksonline.com/, http://www.eipbn.org/historical-proceedings/",

}

Topographical Effect on Natural Killer Cell Locomotion in 3D Microenvironment. / XU, Yuanhao ; Pang, S. W.
2017. Paper presented at 61st International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN 2017), Orlando, Florida, United States.

Research output: Conference Papers › RGC 32 - Refereed conference paper (without host publication) › peer-review

TY - CONF

T1 - Topographical Effect on Natural Killer Cell Locomotion in 3D Microenvironment

AU - XU, Yuanhao

AU - Pang, S. W.

PY - 2017/6

Y1 - 2017/6

M3 - RGC 32 - Refereed conference paper (without host publication)

T2 - 61st International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN 2017)

Y2 - 30 May 2017 through 2 June 2017

ER -