TOF-SIMS

Research output: Conference PapersRGC 31B - Invited conference paper (non-refereed items)Yes

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Author(s)

Related Research Unit(s)

Detail(s)

Original languageEnglish
Pages95-96
Publication statusPublished - May 1993

Conference

Title1st National Conference on Secondary Ion Mass Spectrometry (SIMS I, China)
LocationTsinghua University
PlaceChina
CityBeijing
Period31 May - 5 June 1993

Bibliographic Note

Information for this record is supplemented by the author(s) concerned.

Citation Format(s)

TOF-SIMS. / Chu, Paul K.
1993. 95-96 1st National Conference on Secondary Ion Mass Spectrometry (SIMS I, China), Beijing , China.

Research output: Conference PapersRGC 31B - Invited conference paper (non-refereed items)Yes