Time-dependent creep behavior of amorphous ZrCu and nanocrystalline Zr thin films - A comparison

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)101-106
Journal / PublicationIntermetallics
Volume68
Online published20 Oct 2015
Publication statusPublished - Jan 2016
Externally publishedYes

Abstract

Nanoindentation time-dependent relaxation tests were performed on the amorphous ZrCu, nanocrystalline Zr and multilayer ZrCu/Zr thin films aiming to explore the different time-dependent behaviors of these materials under the similar load level at room temperature. There appears an interesting crossing phenomenon of the creep rate as a function of applied stress. In comparison with the ZrCu thin films, the Zr film shows higher load/stress sensitivity for the creep response, suggesting the operating of dislocation creep along various slip systems and some minor grain-boundary-sliding creep mechanism. Multilayered ZrCu/Zr thin films also exhibit higher creep response due to the presence of numerous interfaces.

Research Area(s)

  • Creep behavior, Metallic glasses, Nanoindentation, Time-dependent