Time-resolved characterization of ferroelectrics using high-energy X-ray diffraction

Diffraction provides an effective means to characterize ferroelectric materials under the application of dynamic and cyclic electric fields. This paper describes a typical time- resolved diffraction setup at a synchrotron facility using high X-ray energies. Such a setup is capable of measuring the structural response of ferroelectric ceramics to electric fields of various frequencies, amplitudes, and waveforms. The use of high energies also allows the response of the sample to be measured at various angles to the applied load. The results of 3 different types of electric loading are presented and discussed: the structural response of ferroelectric ceramics to a single electric field step function, a cyclic electric field of square waveform, and a cyclic electric field of sinusoidal waveform. Each type of electric field loading provides unique information about the material behavior. © 2009 IEEE.