TY - GEN
T1 - Time domain simulation of power electronics circuits using embedded companion models
AU - Chung, Henry Shu hung
AU - Hui, S. Y R
AU - Mak, K. Y.
PY - 1999
Y1 - 1999
N2 - This paper presents a stepwise time-domain simulation technique for analysis of power electronics circuits. New companion models embedding with parasitic resistance of reactive elements and switches are proposed. In every simulation step, a switching circuit is transformed into a resistive network, which is analyzed by modified nodal approach. The switch model enables a switching circuit to be modeled by a constant system matrix, regardless of the switching state. This feature allows a circuit with numerous topologies to be modeled elegantly by one set of algebraic equation, and a reduction of circuit formulation and computation time. By using quadratic extrapolation on circuit waveforms within a simulation step, a simple and direct method is used to determine switching instants. Simulated results are verified with experimental measurements.
AB - This paper presents a stepwise time-domain simulation technique for analysis of power electronics circuits. New companion models embedding with parasitic resistance of reactive elements and switches are proposed. In every simulation step, a switching circuit is transformed into a resistive network, which is analyzed by modified nodal approach. The switch model enables a switching circuit to be modeled by a constant system matrix, regardless of the switching state. This feature allows a circuit with numerous topologies to be modeled elegantly by one set of algebraic equation, and a reduction of circuit formulation and computation time. By using quadratic extrapolation on circuit waveforms within a simulation step, a simple and direct method is used to determine switching instants. Simulated results are verified with experimental measurements.
UR - https://www.scopus.com/pages/publications/0033340991
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0033340991&origin=recordpage
U2 - 10.1109/ISIE.1999.801789
DO - 10.1109/ISIE.1999.801789
M3 - RGC 32 - Refereed conference paper (with host publication)
VL - 1
SP - 226
EP - 231
BT - IEEE International Symposium on Industrial Electronics
PB - IEEE
T2 - Proceedings of the 1999 IEEE International Symposium on Industrial Electronics (ISIE'99)
Y2 - 12 July 1999 through 16 July 1999
ER -