Three-dimensional SU-8 structures by reversal UV imprint
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 2225-2229 |
Journal / Publication | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
Volume | 24 |
Issue number | 5 |
Publication status | Published - 2006 |
Externally published | Yes |
Link(s)
Abstract
In this work, three-dimensional (3D) SU-8 micro- and nanostructures were fabricated using a reversal UV imprint process at low temperature and low pressure. The SU-8 polymer was coated on a patterned glass mold and then transferred onto various substrates by reversal UV imprint at a typical temperature of 50°C, pressure of 1 MPa, and UV exposure of 1 s. The lower temperature and pressure used compared to conventional thermal imprint shorten the imprint time and alleviate pattern distortion. A combination of silanes was used to generate a medium surface energy on the imprint molds to enable polymer spin coating and mold release after imprint. In addition, an O 2 plasma was used for glass mold treatment to improve uniformity of silane coating and to increase substrate surface energy for better polymer adhesion. Using this technology, 100 nm-1 μm wide SU-8 gratings were fabricated on flat or patterned substrates with good fidelity. By repeating this process, multiple-level nanochannels, cavities, or air-bridging polymer structures with 400 nm-10 μm widths have been demonstrated. The surface energy of SU-8 was modified using an O 2 plasma to promote layer adhesion for 3D stacking. This reversal UV imprint technology offers versatility and flexibility to stack polymer layers and multiple-level sealed fluidic channels. © 2006 American Vacuum Society.
Citation Format(s)
Three-dimensional SU-8 structures by reversal UV imprint. / Hu, W.; Yang, B.; Peng, C. et al.
In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 24, No. 5, 2006, p. 2225-2229.
In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 24, No. 5, 2006, p. 2225-2229.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review