Thin structure deflection measurement

Alexandar Djordjevich; YuZhu He

doi:10.1109/19.772201

Thin structure deflection measurement

Alexandar Djordjevich
, YuZhu He

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

27 Citations (Scopus)

Abstract

A method of measuring deflection curvature is introduced. Its conceptual advantages over strain measurement include: position-invariant readings throughout the structural section; sameness of the true and apparent measurands irrespective of the microstructural effects introduced by the sensor; and higher sensitivity in the case of thin structures.

Original language	English
Pages (from-to)	705-710
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	48
Issue number	3
DOIs	https://doi.org/10.1109/19.772201
Publication status	Published - 1999

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title = "Thin structure deflection measurement",

abstract = "A method of measuring deflection curvature is introduced. Its conceptual advantages over strain measurement include: position-invariant readings throughout the structural section; sameness of the true and apparent measurands irrespective of the microstructural effects introduced by the sensor; and higher sensitivity in the case of thin structures.",

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AU - Djordjevich, Alexandar

AU - He, YuZhu

PY - 1999

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U2 - 10.1109/19.772201

DO - 10.1109/19.772201

M3 - RGC 21 - Publication in refereed journal

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SP - 705

EP - 710

JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

IS - 3

ER -

Thin structure deflection measurement

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