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Thermophysical properties of highly doped Si and Ge melts under microgravity

S. M. Chathoth, B. Damaschke, K. Samwer, S. Schneider

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

We have investigated thermal expansion and surface tension of highly doped Si and Ge melts under microgravity conditions. The experiments were conducted in the TEMPUS facility on-board of a Zero-G aircraft. The thermophysical properties were quantified by analyzing the images of levitated droplets. Both Si and Ge are metallic in their solid state at the doping (P and Sb) of 1× 1019 atoms cm-3. However, thermal expansion and surface tension of highly doped Si and Ge melts did not show significant changes in comparison with undoped samples. © 2009 American Institute of Physics.
Original languageEnglish
Article number103524
JournalJournal of Applied Physics
Volume106
Issue number10
DOIs
Publication statusPublished - 2009
Externally publishedYes

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