Abstract
We have investigated thermal expansion and surface tension of highly doped Si and Ge melts under microgravity conditions. The experiments were conducted in the TEMPUS facility on-board of a Zero-G aircraft. The thermophysical properties were quantified by analyzing the images of levitated droplets. Both Si and Ge are metallic in their solid state at the doping (P and Sb) of 1× 1019 atoms cm-3. However, thermal expansion and surface tension of highly doped Si and Ge melts did not show significant changes in comparison with undoped samples. © 2009 American Institute of Physics.
| Original language | English |
|---|---|
| Article number | 103524 |
| Journal | Journal of Applied Physics |
| Volume | 106 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 2009 |
| Externally published | Yes |
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