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Thermomigration in SnPb and Pb-Free Flip-Chip Solder Joints

  • Tian Tian
  • , K. N. Tu
  • , Hsiao-Yun Chen
  • , Hsiang-Yao Hsiao
  • , Chih Chen

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 12 - Chapter in an edited book (Author)peer-review

Original languageEnglish
Title of host publicationLead‐Free Solders
Subtitle of host publicationMaterials Reliability for Electronics
EditorsK. N. Subramanian
PublisherJohn Wiley & Sons
Pages425-442
ISBN (Electronic)9781119966203
ISBN (Print)9780470971826
DOIs
Publication statusPublished - 2012
Externally publishedYes

Research Keywords

  • 3D FEA, in solder bumps
  • Pb free thermomigration
  • Soret effect
  • Thermomigration in SnPb
  • Thermomigration issues
  • TM, and reliability problem

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