Thermal effects on the dielectric and electrical properties of relaxor ferroelectric ceramic-based MLCs

Y. C. Chan; Y. Wang; Z. L. Gui; L. T. Li

Thermal effects on the dielectric and electrical properties of relaxor ferroelectric ceramic-based MLCs

Y. C. Chan
, Y. Wang
, Z. L. Gui
, L. T. Li

City University of Hong Kong

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

5 Citations (Scopus)

Abstract

The effects of different thermal shock treatments on dielectric and electrical properties of relaxor based and BaTiO₃ based '0805' Y5V multilayer ceramic chip capacitors (MLCs) were investigated. It was found that thermal shock generally resulted in larger leakage currents and lower breakdown voltages. It is also confirmed that the thermal shock resistance of relaxor MLCs is in disadvantage to that of the barium titanate MLCs. Nevertheless, no obvious failure was found when the relaxor-based MLCs were subjected to the thermal effects in the normal infrared solder reflow process. Besides the relatively lower mechanical strength, low insulation resistivity and breakdown strength were also proposed to be important contributors to the undesirable reliability of relaxor MLCs.

Original language	English
Title of host publication	Proceedings of the IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium
Publisher	IEEE
Pages	328-333
Publication status	Published - 1995
Event	Proceedings of the 1995 IEEE/CPMT 18th International Electronic Manufacturing Technology - Omiya, Jpn Duration: 4 Dec 1995 → 6 Dec 1995

Conference

Conference	Proceedings of the 1995 IEEE/CPMT 18th International Electronic Manufacturing Technology
City	Omiya, Jpn
Period	4/12/95 → 6/12/95

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@inproceedings{8f12226c5586473090735f866b792db7,

title = "Thermal effects on the dielectric and electrical properties of relaxor ferroelectric ceramic-based MLCs",

abstract = "The effects of different thermal shock treatments on dielectric and electrical properties of relaxor based and BaTiO3 based '0805' Y5V multilayer ceramic chip capacitors (MLCs) were investigated. It was found that thermal shock generally resulted in larger leakage currents and lower breakdown voltages. It is also confirmed that the thermal shock resistance of relaxor MLCs is in disadvantage to that of the barium titanate MLCs. Nevertheless, no obvious failure was found when the relaxor-based MLCs were subjected to the thermal effects in the normal infrared solder reflow process. Besides the relatively lower mechanical strength, low insulation resistivity and breakdown strength were also proposed to be important contributors to the undesirable reliability of relaxor MLCs.",

author = "Chan, \{Y. C.\} and Y. Wang and Gui, \{Z. L.\} and Li, \{L. T.\}",

year = "1995",

language = "English",

pages = "328--333",

booktitle = "Proceedings of the IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium",

publisher = "IEEE",

address = "United States",

note = "Proceedings of the 1995 IEEE/CPMT 18th International Electronic Manufacturing Technology ; Conference date: 04-12-1995 Through 06-12-1995",

}

Chan, YC, Wang, Y, Gui, ZL & Li, LT 1995, Thermal effects on the dielectric and electrical properties of relaxor ferroelectric ceramic-based MLCs. in Proceedings of the IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium. IEEE, pp. 328-333, Proceedings of the 1995 IEEE/CPMT 18th International Electronic Manufacturing Technology, Omiya, Jpn, 4/12/95.

Thermal effects on the dielectric and electrical properties of relaxor ferroelectric ceramic-based MLCs. / Chan, Y. C.; Wang, Y.; Gui, Z. L. et al.
Proceedings of the IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium. IEEE, 1995. p. 328-333.

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - Thermal effects on the dielectric and electrical properties of relaxor ferroelectric ceramic-based MLCs

AU - Chan, Y. C.

AU - Wang, Y.

AU - Gui, Z. L.

AU - Li, L. T.

PY - 1995

Y1 - 1995

N2 - The effects of different thermal shock treatments on dielectric and electrical properties of relaxor based and BaTiO3 based '0805' Y5V multilayer ceramic chip capacitors (MLCs) were investigated. It was found that thermal shock generally resulted in larger leakage currents and lower breakdown voltages. It is also confirmed that the thermal shock resistance of relaxor MLCs is in disadvantage to that of the barium titanate MLCs. Nevertheless, no obvious failure was found when the relaxor-based MLCs were subjected to the thermal effects in the normal infrared solder reflow process. Besides the relatively lower mechanical strength, low insulation resistivity and breakdown strength were also proposed to be important contributors to the undesirable reliability of relaxor MLCs.

AB - The effects of different thermal shock treatments on dielectric and electrical properties of relaxor based and BaTiO3 based '0805' Y5V multilayer ceramic chip capacitors (MLCs) were investigated. It was found that thermal shock generally resulted in larger leakage currents and lower breakdown voltages. It is also confirmed that the thermal shock resistance of relaxor MLCs is in disadvantage to that of the barium titanate MLCs. Nevertheless, no obvious failure was found when the relaxor-based MLCs were subjected to the thermal effects in the normal infrared solder reflow process. Besides the relatively lower mechanical strength, low insulation resistivity and breakdown strength were also proposed to be important contributors to the undesirable reliability of relaxor MLCs.

UR - https://www.scopus.com/pages/publications/0029457714

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0029457714&origin=recordpage

M3 - RGC 32 - Refereed conference paper (with host publication)

SP - 328

EP - 333

BT - Proceedings of the IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium

PB - IEEE

T2 - Proceedings of the 1995 IEEE/CPMT 18th International Electronic Manufacturing Technology

Y2 - 4 December 1995 through 6 December 1995

ER -

Thermal effects on the dielectric and electrical properties of relaxor ferroelectric ceramic-based MLCs

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