Abstract
A novel etching effect of hydrogen ions on the growth of diamond films was observed. The H+ ion bombardment was performed by applying a negative substrate bias during a microwave plasma chemical vapor deposition process, using only hydrogen as a reactant gas. The effect of this bombardment was investigated by means of scanning electron microscopy. It was found that the etching efficiency of H+ ions on non-[001]-oriented grains is more significant than that on grains with their (001) faces parallel to the substrate. A lateral growth of the (001) faces can occur during the bombardment process. As a result, the size of (001) faces increases after H+ etching while grains with other directions are etched off. This effect provides a way to improve the orientation degree of [001] oriented diamond films and might be helpful for obtaining [001] oriented diamond films with small thickness. © 1997 American Institute of Physics.
| Original language | English |
|---|---|
| Pages (from-to) | 1896-1899 |
| Journal | Journal of Applied Physics |
| Volume | 82 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 15 Aug 1997 |
| Externally published | Yes |
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