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The role of interfacial strain in the surface p4g reconstruction: A comparison between Pd(001)-(2 × 2)p4g-Al and Cu3Pt(001)

Y. G. Shen, D. J. O'Connor, R. J. MacDonald

Research output: Journal Publications and ReviewsRGC 62 - Review of books or of software (or similar publications/items)peer-review

Abstract

The surface composition and structure of the Pd(001)-(2 × 2)p4g-Al phase have been studied by low-energy ion scattering (LEIS) and low-energy electron diffraction (LEED). It was found that annealing Al-covered surfaces with initial coverages from half to larger than one monolayer (ML) to about 900 K gave rise to a stable (2 × 2)p4g LEED pattern. The ion scattering data suggest that the reconstruction is due to an ordered c(2 × 2) Al-Pd underlayer below a clock-rotated (001) Pd termination. To better understand the Pd(001)-(2 × 2)p4g-Al system, we have also studied an ordered Cu3Pt(001) alloy surface, which exhibits the stable c(2 × 2) structure with an ordered c(2 × 2) Cu-Pt underlayer below a (1 × 1) Cu termination. Strain analysis shows that the top-layer reconstruction for the (2 × 2)p4g surface is caused by the Al-induced interfacial strain.
Original languageEnglish
Pages (from-to)8345-8358
JournalJournal of Physics Condensed Matter
Volume9
Issue number40
DOIs
Publication statusPublished - 6 Oct 1997
Externally publishedYes

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