Abstract
The pitting corrosion behavior in deaerated 0.05M NaCl solution of titanium ion implanted aluminum has been investigated. The samples were implanted with Ti ions using a Mevva high current metal ion implantation facility at doses ranging from 2×1015 to 2×1017 ions/cm2 and with ion energy from 30 to 120 keV, and the resultant Ti depth profiles were measured with Rutherford backscattering spectrometry (RBS). The pit density was decreased by up to two orders of magnitude relative to the unimplanted samples. The pitting potential increase ranged from 0.1 to 0.3 V. The pitting potential increase of the high dose samples was limited by pit formation at pre-existing scratches whereas the majority of the surface was free of pits to potentials up to 5 VSCE. © 1993.
| Original language | English |
|---|---|
| Pages (from-to) | 267-270 |
| Journal | Nuclear Inst. and Methods in Physics Research, B |
| Volume | 80-81 |
| Issue number | Part 1 |
| DOIs | |
| Publication status | Published - 3 Jun 1993 |
| Externally published | Yes |