The pico-Newton order force measurement with a calibrated carbon nanotube probe

Fumihito Arai, Masahiro Nakajima, Lixin Dong, Toshio Fukuda

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

3 Citations (Scopus)

Abstract

Force measurement with pico-Newton (pN) order resolution using a carbon nanotube (CNT) probe, which is calibrated by the electromechanical resonance, is presented. Based on the theoretical analysis, a CNT is suitable material for the sensitive force measurement. A CNT probe is constructed by attaching a CNT to the tip of the commercial available atomic force microscope (AFM) cantilever or tungsten needle probe by the electron-beam-induced deposition (EBID) though the nanorobotic manipulators inside a field-emission scanning electron microscope (FE-SEM). In order to attach a CNT quickly and correctly, CNTs are dispersed in ethanol by ultrasonic waves for several hours and oriented by electrophoresis. The elastic moduli of CNTs are calibrated from electromechanical resonance frequency by applied electrostatic forces. We measured pico-Newton order contact forces with a CNT probe, which is constructed with nanorobotic manipulators, by measuring deformation of a CNT probe from FE-SEM images.
Original languageEnglish
Title of host publicationProceedings of the 2003 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM 2003)
PublisherIEEE
Pages691-696
ISBN (Print)0-7803-7759-1
DOIs
Publication statusPublished - Jul 2003
Externally publishedYes
Event2003 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2003 - Kobe, Japan
Duration: 20 Jul 200324 Jul 2003

Publication series

NameIEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM
Volume2

Conference

Conference2003 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2003
PlaceJapan
CityKobe
Period20/07/0324/07/03

Research Keywords

  • Atomic force microscopy
  • Atomic layer deposition
  • Carbon nanotubes
  • Electrostatic measurements
  • Force measurement
  • Joining processes
  • Probes
  • Resonance
  • Scanning electron microscopy
  • Ultrasonic variables measurement

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