The origin of gate bias stress instability and hysteresis in monolayer WS2 transistors

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Projects

  1. TBRS: A Compact System for Terahertz Imaging and Spectroscopy

    CHAN, C. H., LO, K. W. K., LUK, K. M., PUN, Y. B. E., Pang, S., SHAW, J., VELLAISAMY, A. L. R., CHAN, S. C., DECROZE, C., HO, J. C. Y., JARRAHI, M., LAM, Y. W., LEE, E. J., LEE, N. P. Y., LEUNG, K. W., LIU, H., QU, S., RENAUD, C., Tong, K., WANG, C., WONG, H., WONG, C. Y. A., WONG, M. H. A. & Wong, K. K. Y.

    1/01/1730/06/23

    Project: Research