The origin of gate bias stress instability and hysteresis in monolayer WS2 transistors
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Projects
TBRS: A Compact System for Terahertz Imaging and Spectroscopy
CHAN, C. H., LO, K. W. K., LUK, K. M., PUN, Y. B. E., Pang, S., SHAW, J., VELLAISAMY, A. L. R., CHAN, S. C., DECROZE, C., HO, J. C. Y., JARRAHI, M., LAM, Y. W., LEE, E. J., LEE, N. P. Y., LEUNG, K. W., LIU, H., QU, S., RENAUD, C., Tong, K., WANG, C., WONG, H., WONG, C. Y. A., WONG, M. H. A. & Wong, K. K. Y.
1/01/17 → 30/06/23
Project: Research