TY - GEN
T1 - The optical constants of thin films calculated from reflectance and transmittance measurements
AU - Chiang, Donyau
AU - Chu, Cheng Hung
AU - Chiang, Hai-Pang
AU - Tsai, Din Ping
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 2009
Y1 - 2009
N2 - The refraction index n and extinguished coefficient k of materials can be calculated from their reflection and transmittance measurements with varied wavelengths. The organic and inorganic materials used for optical recording medium materials are examined. The organic dyes show that significant optical constants vary with the laser wavelength, in comparison to the inorganic phase-change materials. © 2009 IEEE.
AB - The refraction index n and extinguished coefficient k of materials can be calculated from their reflection and transmittance measurements with varied wavelengths. The organic and inorganic materials used for optical recording medium materials are examined. The organic dyes show that significant optical constants vary with the laser wavelength, in comparison to the inorganic phase-change materials. © 2009 IEEE.
UR - https://www.scopus.com/pages/publications/70349274243
UR - https://www.scopus.com/pages/publications/70349274243#tab=impact
U2 - 10.1109/ODS.2009.5031741
DO - 10.1109/ODS.2009.5031741
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 9781424433438
T3 - 2009 Optical Data Storage Topical Meeting, ODS 2009
SP - 101
EP - 103
BT - 2009 Optical Data Storage Topical Meeting, ODS 2009
T2 - 2009 Optical Data Storage Topical Meeting, ODS 2009
Y2 - 10 May 2009 through 13 May 2009
ER -