Abstract
First-order and second-order gratings for the 1.55 μm wavelength InGaAsP laser have been fabricated by e-beam lithography on the InP substrate. The pattern is transferred into the InP substrate by wet chemical etching using HNO3:HBr:H2O and reactive ion etching using the gas mixture CH4:H2:Ar2. The experimental results have proven that a PMMA resist of 200 nm thickness can not only stand up to wet chemical etching but also to reactive ion etching.
| Original language | English |
|---|---|
| Title of host publication | Fifth Asia-Pacific Conference Communications and Fourth Optoloelectronics and Communications Conference on communications |
| Publisher | IEEE |
| Pages | 1545-1547 |
| Volume | 2 |
| ISBN (Print) | 7-5635-0402-8 |
| DOIs | |
| Publication status | Published - Oct 1999 |
| Event | 5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999 - Beijing, China Duration: 18 Oct 1999 → 22 Oct 1999 |
Conference
| Conference | 5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999 |
|---|---|
| Place | China |
| City | Beijing |
| Period | 18/10/99 → 22/10/99 |
Research Keywords
- Optical device fabrication
- Gratings
- Optical arrays
- Wet etching
- Chemical lasers
- Indium phosphide
- Gas lasers
- Lithography
- Argon
- Resists
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