The exact channel density and compound design for generic universal switch blocks
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Article number | 1230811 |
Journal / Publication | ACM Transactions on Design Automation of Electronic Systems |
Volume | 12 |
Issue number | 2 |
Publication status | Published - 1 Apr 2007 |
Externally published | Yes |
Link(s)
Abstract
A switch block of k sides W terminals on each side is said to be universal (a (k, W)-USB) if it is routable for every set of 2-pin nets of channel density at most W. The generic optimum universal switch block design problem is to design a (k, W)-USB with the minimum number of switches for every pair of (k, W). This problem was first proposed and solved for k = 4 in Chang et al. [1996], and then solved for even W or for k ≤ 6 in Shyu et al. [2000] and Fan et al. [2002b]. No optimum (k, W)-USB is known for k ≥ 7 and odd W ≥ 3. But it is already known that when W is a large odd number, a near-optimum (k, W)-USB can be obtained by a disjoint union of (W - f2(k))/2 copies of the optimum (k, 2)-USB and a noncompound (k, f2(k))-USB, where the value of f2(k) is unknown for k ≥ 8. In this article, we show that f2(k) = k+3-i/3, where 1 ≤ i ≤ 6 and i ≡ k (mod 6), and present an explicit design for the noncompound (k, f2(k))-USB. Combining these two results we obtain the exact designs of (k, W)-USBs for all k ≥ 7 and odd W ≥ 3. The new (k, W)-USB designs also yield an efficient detailed routing algorithm. © 2007 ACM.
Research Area(s)
- FPGA architecture, Routing algorithm, Universal switch block
Citation Format(s)
The exact channel density and compound design for generic universal switch blocks. / Fan, Hongbing; Liu, Jiping; Wu, Yu-Liang; Cheung, Chak-Chung.
In: ACM Transactions on Design Automation of Electronic Systems, Vol. 12, No. 2, 1230811, 01.04.2007.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review