Skip to main navigation Skip to search Skip to main content

The Effect of Tensile Strain on Optical Anisotropy and Exciton of m-Plane ZnO

  • H. H. Wang
  • , J. S. Tian
  • , C. Y. Chen
  • , H. H. Huang
  • , Y. C. Yeh
  • , P. Y. Deng
  • , L. Chang
  • , Y. H. Chu
  • , Y. R. Wu
  • , J. H. He*
  • *Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

The near band edge emission of the tensile-strained m-plane ZnO film grown on (112)LaAlO3 substrates shows abnormal low polarization degree (ρ = 0.1). The temperature dependency of polarization degree clarifies the origins of different emission peaks. In tensile-strained m-plane ZnO, the [0001] polarized state is upper shifted and is overlapping with the [112¯0] polarized state. This phenomenon causes the abnormal low polarization degree and reveals the effect of strain on the emission anisotropy of m-plane ZnO.
Original languageEnglish
Article number6800708
JournalIEEE Photonics Journal
Volume7
Issue number2
Online published20 Mar 2015
DOIs
Publication statusPublished - Apr 2015
Externally publishedYes

Research Keywords

  • II-VI semiconductor materials
  • Optical films
  • optical polarization
  • photoluminescence
  • strain

Fingerprint

Dive into the research topics of 'The Effect of Tensile Strain on Optical Anisotropy and Exciton of m-Plane ZnO'. Together they form a unique fingerprint.

Cite this