Abstract
The near band edge emission of the tensile-strained m-plane ZnO film grown on (112)LaAlO3 substrates shows abnormal low polarization degree (ρ = 0.1). The temperature dependency of polarization degree clarifies the origins of different emission peaks. In tensile-strained m-plane ZnO, the [0001] polarized state is upper shifted and is overlapping with the [112¯0] polarized state. This phenomenon causes the abnormal low polarization degree and reveals the effect of strain on the emission anisotropy of m-plane ZnO.
| Original language | English |
|---|---|
| Article number | 6800708 |
| Journal | IEEE Photonics Journal |
| Volume | 7 |
| Issue number | 2 |
| Online published | 20 Mar 2015 |
| DOIs | |
| Publication status | Published - Apr 2015 |
| Externally published | Yes |
Research Keywords
- II-VI semiconductor materials
- Optical films
- optical polarization
- photoluminescence
- strain
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