The effect of temperature on manual dexterity, reaction time, and optimum grip-span

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)

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Author(s)

Detail(s)

Original languageEnglish
Title of host publicationLecture Notes in Engineering and Computer Science
PublisherNewswood Limited
Pages953-957
Volume2
ISBN (Print)9789881925398
Publication statusPublished - 2015

Publication series

Name
Volume2
ISSN (Print)2078-0958

Conference

TitleInternational MultiConference of Engineers and Computer Scientists 2015, IMECS 2015
PlaceHong Kong
CityTsimshatsui, Kowloon
Period18 - 20 March 2015

Abstract

Industries such as fish filleting, meat packaging, cold storage and outdoor jobs require workers to work in cold environments. An experiment was conducted to investigate the effect of cold on manual dexterity, reaction time and optimum grip-span. The participants were twelve healthy male university students (median = 20 years). The results showed that performance on the O'Connor dexterity test, stabilimeter and reaction time tests was significantly lower at low temperature (10 °C) compared to performance at higher temperatures (20 °C and 30 °C). Optimum grip-span at 10 °C was narrower than at 20 °C and 30 °C. In conclusion, the performance measures at 10 °C were degraded compared to performance at the higher temperature levels tested. The results of this study on the performance of people in cold environments provide important information for work design in such industries.

Research Area(s)

  • Cold immersion, Dexterity, Grip-span, Reaction time, Temperature

Citation Format(s)

The effect of temperature on manual dexterity, reaction time, and optimum grip-span. / Dizmen, Coskun; Man, Ken S.S.; Chan, Alan H.S.

Lecture Notes in Engineering and Computer Science. Vol. 2 Newswood Limited, 2015. p. 953-957.

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)